智(zhi)(zhi)能(neng)電(dian)(dian)(dian)(dian)(dian)阻(zu)具有更高(gao)的(de)(de)精度(du)和(he)穩定性(xing)。傳(chuan)(chuan)統(tong)的(de)(de)電(dian)(dian)(dian)(dian)(dian)阻(zu)測(ce)(ce)試儀(yi)器往往受(shou)到(dao)環境(jing)因素(su)的(de)(de)影(ying)響，導致(zhi)測(ce)(ce)試結果的(de)(de)不準確。而(er)智(zhi)(zhi)能(neng)電(dian)(dian)(dian)(dian)(dian)阻(zu)通過內置的(de)(de)智(zhi)(zhi)能(neng)芯(xin)片和(he)傳(chuan)(chuan)感器，可以實(shi)時(shi)(shi)監(jian)測(ce)(ce)環境(jing)溫度(du)、濕(shi)度(du)等因素(su)，并自(zi)動(dong)進行(xing)校準，從而(er)提(ti)(ti)高(gao)測(ce)(ce)試的(de)(de)精度(du)和(he)穩定性(xing)。這(zhe)將(jiang)提(ti)(ti)高(gao)電(dian)(dian)(dian)(dian)(dian)子(zi)產品(pin)的(de)(de)質量和(he)可靠性(xing)，滿(man)足市場對(dui)產品(pin)的(de)(de)需求(qiu)。智(zhi)(zhi)能(neng)電(dian)(dian)(dian)(dian)(dian)阻(zu)具有更高(gao)的(de)(de)自(zi)動(dong)化程度(du)。傳(chuan)(chuan)統(tong)的(de)(de)電(dian)(dian)(dian)(dian)(dian)阻(zu)測(ce)(ce)試需要人工操作(zuo)，耗時(shi)(shi)耗力且(qie)容易出錯(cuo)。而(er)智(zhi)(zhi)能(neng)電(dian)(dian)(dian)(dian)(dian)阻(zu)可以通過與測(ce)(ce)試設(she)備的(de)(de)連接，實(shi)現自(zi)動(dong)化測(ce)(ce)試。只(zhi)需設(she)置測(ce)(ce)試參數(shu)，智(zhi)(zhi)能(neng)電(dian)(dian)(dian)(dian)(dian)阻(zu)就(jiu)能(neng)自(zi)動(dong)完成測(ce)(ce)試，并將(jiang)測(ce)(ce)試結果傳(chuan)(chuan)輸給(gei)設(she)備或計算機進行(xing)分析(xi)。這(zhe)不僅(jin)提(ti)(ti)高(gao)了測(ce)(ce)試的(de)(de)效率，還減少了人為因素(su)對(dui)測(ce)(ce)試結果的(de)(de)影(ying)響，提(ti)(ti)高(gao)了測(ce)(ce)試的(de)(de)準確性(xing)。產生離子(zi)遷移(yi)的(de)(de)原因，是當絕緣體(ti)兩端的(de)(de)金(jin)屬(shu)之(zhi)間有直(zhi)流電(dian)(dian)(dian)(dian)(dian)場時(shi)(shi)，這(zhe)兩邊(bian)的(de)(de)金(jin)屬(shu)就(jiu)成為兩個電(dian)(dian)(dian)(dian)(dian)極(ji)。廣東SIR和(he)CAF電(dian)(dian)(dian)(dian)(dian)阻(zu)測(ce)(ce)試設(she)備

離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)測(ce)試(shi)(shi)廣泛應用(yong)于(yu)電(dian)(dian)(dian)子(zi)(zi)(zi)(zi)產品制造和(he)質(zhi)量(liang)(liang)(liang)(liang)控制過程中(zhong)。它可(ke)以(yi)用(yong)于(yu)檢測(ce)電(dian)(dian)(dian)子(zi)(zi)(zi)(zi)元器件(jian)、印刷電(dian)(dian)(dian)路板、電(dian)(dian)(dian)子(zi)(zi)(zi)(zi)設備外(wai)殼等材(cai)料的(de)質(zhi)量(liang)(liang)(liang)(liang)。通(tong)(tong)(tong)過測(ce)試(shi)(shi)，可(ke)以(yi)及時發現材(cai)料中(zhong)的(de)離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)問題和(he)絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)異(yi)常，從而采取相(xiang)應的(de)措施進(jin)行(xing)(xing)修(xiu)復或更(geng)換，確保電(dian)(dian)(dian)子(zi)(zi)(zi)(zi)產品的(de)質(zhi)量(liang)(liang)(liang)(liang)和(he)可(ke)靠性。離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)測(ce)試(shi)(shi)的(de)方(fang)法(fa)主要包括濕(shi)度(du)試(shi)(shi)驗(yan)、電(dian)(dian)(dian)壓加(jia)(jia)速(su)試(shi)(shi)驗(yan)和(he)絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)測(ce)量(liang)(liang)(liang)(liang)。濕(shi)度(du)試(shi)(shi)驗(yan)是(shi)將材(cai)料置于(yu)高濕(shi)度(du)環境中(zhong)，通(tong)(tong)(tong)過觀察離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)現象來(lai)評(ping)估(gu)材(cai)料的(de)質(zhi)量(liang)(liang)(liang)(liang)。電(dian)(dian)(dian)壓加(jia)(jia)速(su)試(shi)(shi)驗(yan)是(shi)在高電(dian)(dian)(dian)壓條件(jian)下進(jin)行(xing)(xing)離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)測(ce)試(shi)(shi)，以(yi)加(jia)(jia)速(su)離(li)子(zi)(zi)(zi)(zi)遷(qian)移(yi)(yi)(yi)速(su)率，從而更(geng)快地評(ping)估(gu)材(cai)料的(de)質(zhi)量(liang)(liang)(liang)(liang)。絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)測(ce)量(liang)(liang)(liang)(liang)是(shi)通(tong)(tong)(tong)過測(ce)量(liang)(liang)(liang)(liang)材(cai)料的(de)絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)值來(lai)評(ping)估(gu)材(cai)料的(de)絕(jue)(jue)(jue)緣(yuan)性能。SIR絕(jue)(jue)(jue)緣(yuan)電(dian)(dian)(dian)阻(zu)測(ce)試(shi)(shi)分析選擇(ze)智(zhi)能電(dian)(dian)(dian)阻(zu)時，用(yong)戶需要根據具體需求考慮精度(du)、穩(wen)定性、接口等因素，以(yi)便選擇(ze)適合的(de)智(zhi)能電(dian)(dian)(dian)阻(zu)產品。

離子(zi)遷移(yi)的(de)(de)兩大(da)階段(duan)離子(zi)遷移(yi)發(fa)生(sheng)的(de)(de)主因是樹脂與(yu)玻(bo)纖(xian)之(zhi)間的(de)(de)附著力(li)不足，或含浸(jin)時親(qin)膠(jiao)性(xing)不良，兩者之(zhi)間一(yi)旦出(chu)(chu)現間隙（Gap）后，又在偏壓(ya)驅動之(zhi)下(xia)，使(shi)得(de)銅(tong)鹽獲得(de)可(ke)移(yi)動的(de)(de)路徑(jing)后，于(yu)是CAF就進一(yi)步形(xing)(xing)成了。離子(zi)遷移(yi)的(de)(de)發(fa)生(sheng)可(ke)分為兩階段(duan)：STEPl是高(gao)溫高(gao)濕的(de)(de)影響下(xia)，使(shi)得(de)樹脂與(yu)玻(bo)纖(xian)之(zhi)間的(de)(de)附著力(li)出(chu)(chu)現劣化，并促(cu)成玻(bo)纖(xian)表(biao)面硅烷處理層產生(sheng)水(shui)解(jie)，進而形(xing)(xing)成了對(dui)銅(tong)金屬腐蝕的(de)(de)環境(jing)。STEP2則(ze)已(yi)出(chu)(chu)現了銅(tong)腐蝕的(de)(de)水(shui)解(jie)反應(ying)，并形(xing)(xing)成了銅(tong)鹽的(de)(de)沉積物，已(yi)到達不可(ke)逆(ni)反應(ying)，其反應(ying)式(shi)如下(xia)：

為了評(ping)估PCB板(ban)(ban)的(de)(de)(de)(de)(de)(de)(de)絕(jue)緣(yuan)(yuan)(yuan)(yuan)性(xing)(xing)能，可以(yi)進行(xing)(xing)離(li)子(zi)(zi)遷移測(ce)(ce)試(shi)(shi)。這項測(ce)(ce)試(shi)(shi)主要通(tong)過測(ce)(ce)量(liang)PCB板(ban)(ban)上(shang)(shang)的(de)(de)(de)(de)(de)(de)(de)絕(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)阻(zu)(zu)來評(ping)估其(qi)絕(jue)緣(yuan)(yuan)(yuan)(yuan)性(xing)(xing)能。絕(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)阻(zu)(zu)是(shi)指在(zai)特定(ding)的(de)(de)(de)(de)(de)(de)(de)電(dian)壓下，單(dan)位面積(ji)上(shang)(shang)的(de)(de)(de)(de)(de)(de)(de)電(dian)流(liu)(liu)(liu)流(liu)(liu)(liu)過的(de)(de)(de)(de)(de)(de)(de)電(dian)阻(zu)(zu)。通(tong)過測(ce)(ce)量(liang)絕(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)阻(zu)(zu)，可以(yi)判斷PCB板(ban)(ban)的(de)(de)(de)(de)(de)(de)(de)絕(jue)緣(yuan)(yuan)(yuan)(yuan)性(xing)(xing)能是(shi)否符合要求。在(zai)進行(xing)(xing)離(li)子(zi)(zi)遷移測(ce)(ce)試(shi)(shi)時，需要使用的(de)(de)(de)(de)(de)(de)(de)測(ce)(ce)試(shi)(shi)設備(bei)。首先，將PCB板(ban)(ban)放置在(zai)測(ce)(ce)試(shi)(shi)設備(bei)上(shang)(shang)，并施加(jia)一定(ding)的(de)(de)(de)(de)(de)(de)(de)電(dian)壓。然后，測(ce)(ce)量(liang)電(dian)流(liu)(liu)(liu)流(liu)(liu)(liu)過的(de)(de)(de)(de)(de)(de)(de)電(dian)阻(zu)(zu)，以(yi)確定(ding)絕(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)阻(zu)(zu)的(de)(de)(de)(de)(de)(de)(de)大小。如果(guo)絕(jue)緣(yuan)(yuan)(yuan)(yuan)電(dian)阻(zu)(zu)低于規(gui)定(ding)的(de)(de)(de)(de)(de)(de)(de)標準(zhun)值(zhi)，就(jiu)說明PCB板(ban)(ban)的(de)(de)(de)(de)(de)(de)(de)絕(jue)緣(yuan)(yuan)(yuan)(yuan)性(xing)(xing)能不(bu)達(da)標，需要進行(xing)(xing)進一步的(de)(de)(de)(de)(de)(de)(de)處理或(huo)更換。表(biao)面絕(jue)緣(yuan)(yuan)(yuan)(yuan)阻(zu)(zu)抗(SIR)測(ce)(ce)試(shi)(shi)數(shu)據(ju)可以(yi)直接反(fan)映(ying)PCBA的(de)(de)(de)(de)(de)(de)(de)表(biao)面清潔度（包括加(jia)工、制(zhi)造過程的(de)(de)(de)(de)(de)(de)(de)殘留(liu)）。

Sir電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)是一種(zhong)非接(jie)觸(chu)式(shi)的(de)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)方(fang)(fang)(fang)法，這種(zhong)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)方(fang)(fang)(fang)法不需(xu)要(yao)直接(jie)接(jie)觸(chu)電(dian)(dian)(dian)路(lu)(lu)，因此(ci)可以(yi)(yi)(yi)避免對電(dian)(dian)(dian)路(lu)(lu)的(de)損壞。同(tong)時，Sir電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)還具(ju)有高(gao)精度(du)(du)和(he)(he)高(gao)速(su)度(du)(du)的(de)優點(dian)，可以(yi)(yi)(yi)快(kuai)速(su)準(zhun)確(que)地(di)測(ce)(ce)(ce)(ce)(ce)量電(dian)(dian)(dian)路(lu)(lu)中(zhong)的(de)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)值。它可以(yi)(yi)(yi)用(yong)來測(ce)(ce)(ce)(ce)(ce)量電(dian)(dian)(dian)路(lu)(lu)中(zhong)的(de)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)值。這種(zhong)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)方(fang)(fang)(fang)法具(ju)有高(gao)精度(du)(du)和(he)(he)高(gao)速(su)度(du)(du)的(de)優點(dian)，可以(yi)(yi)(yi)快(kuai)速(su)準(zhun)確(que)地(di)測(ce)(ce)(ce)(ce)(ce)量電(dian)(dian)(dian)路(lu)(lu)中(zhong)的(de)電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)值。同(tong)時，它還可以(yi)(yi)(yi)用(yong)來檢測(ce)(ce)(ce)(ce)(ce)電(dian)(dian)(dian)路(lu)(lu)中(zhong)的(de)其(qi)他問題，如短路(lu)(lu)和(he)(he)斷(duan)路(lu)(lu)。因此(ci)，掌握Sir電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)方(fang)(fang)(fang)法對于電(dian)(dian)(dian)子(zi)工(gong)程師來說非常重要(yao)。無論是在實驗室(shi)環(huan)境還是在工(gong)業生產中(zhong)，Sir電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)都可以(yi)(yi)(yi)發(fa)揮(hui)重要(yao)作(zuo)用(yong)，提高(gao)工(gong)作(zuo)效(xiao)率。監測(ce)(ce)(ce)(ce)(ce)模(mo)塊：狀態、數據曲線(xian)、測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)配置、增加測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)、預警。江(jiang)西SIR和(he)(he)CAF表面絕緣電(dian)(dian)(dian)阻(zu)(zu)(zu)(zu)測(ce)(ce)(ce)(ce)(ce)試(shi)(shi)分析(xi)

傳統的(de)電(dian)阻(zu)器(qi)件在測(ce)量(liang)電(dian)阻(zu)時可能存在一定(ding)的(de)誤差(cha)。廣(guang)東SIR和CAF電(dian)阻(zu)測(ce)試設備

PCB/PCBA絕(jue)緣(yuan)(yuan)失效是指(zhi)(zhi)電(dian)(dian)(dian)介(jie)(jie)(jie)質在電(dian)(dian)(dian)壓(ya)(ya)作用(yong)下會(hui)產生能(neng)(neng)量損(sun)耗(hao)(hao)，這(zhe)種(zhong)損(sun)耗(hao)(hao)很大時(shi)，原先的(de)電(dian)(dian)(dian)能(neng)(neng)轉(zhuan)化(hua)(hua)(hua)(hua)為(wei)熱能(neng)(neng)，使電(dian)(dian)(dian)介(jie)(jie)(jie)質溫度升高，絕(jue)緣(yuan)(yuan)老化(hua)(hua)(hua)(hua)，甚至(zhi)使電(dian)(dian)(dian)介(jie)(jie)(jie)質熔化(hua)(hua)(hua)(hua)、燒(shao)焦，**終(zhong)喪(sang)失絕(jue)緣(yuan)(yuan)性(xing)能(neng)(neng)而(er)發生熱擊(ji)穿。電(dian)(dian)(dian)介(jie)(jie)(jie)質的(de)損(sun)耗(hao)(hao)是衡量其(qi)絕(jue)緣(yuan)(yuan)性(xing)能(neng)(neng)的(de)重要指(zhi)(zhi)標，電(dian)(dian)(dian)介(jie)(jie)(jie)質即絕(jue)緣(yuan)(yuan)材料，是電(dian)(dian)(dian)氣設(she)備、裝置中用(yong)來隔離存在不(bu)同(tong)點(dian)位的(de)導體的(de)物質，通過各(ge)類導體間的(de)絕(jue)緣(yuan)(yuan)隔斷功能(neng)(neng)控制電(dian)(dian)(dian)流的(de)方向。電(dian)(dian)(dian)介(jie)(jie)(jie)質長(chang)期(qi)受到點(dian)場(chang)、熱能(neng)(neng)、機械應力等的(de)破壞。在電(dian)(dian)(dian)場(chang)的(de)作用(yong)下，電(dian)(dian)(dian)介(jie)(jie)(jie)質會(hui)發生極化(hua)(hua)(hua)(hua)、電(dian)(dian)(dian)導、耗(hao)(hao)損(sun)和擊(ji)穿等現象(xiang)，這(zhe)些現象(xiang)的(de)相(xiang)關物理參(can)數可(ke)以用(yong)相(xiang)對介(jie)(jie)(jie)電(dian)(dian)(dian)系數、電(dian)(dian)(dian)導率、介(jie)(jie)(jie)質損(sun)耗(hao)(hao)因(yin)數、擊(ji)穿電(dian)(dian)(dian)壓(ya)(ya)來表(biao)征。廣東SIR和CAF電(dian)(dian)(dian)阻測試設(she)備

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